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GAL16V8Z GAL16V8ZD
Zero Power E2CMOS PLD Features
* ZERO POWER E2CMOS TECHNOLOGY -- 100A Standby Current -- Input Transition Detection on GAL16V8Z -- Dedicated Power-down Pin on GAL16V8ZD -- Input and Output Latching During Power Down * HIGH PERFORMANCE E2CMOS TECHNOLOGY -- 12 ns Maximum Propagation Delay -- Fmax = 83.3 MHz -- 8 ns Maximum from Clock Input to Data Output -- TTL Compatible 16 mA Output Drive -- UltraMOS(R) Advanced CMOS Technology * E2 CELL TECHNOLOGY -- Reconfigurable Logic -- Reprogrammable Cells -- 100% Tested/100% Yields -- High Speed Electrical Erasure (<100ms) -- 20 Year Data Retention * EIGHT OUTPUT LOGIC MACROCELLS -- Maximum Flexibility for Complex Logic Designs -- Programmable Output Polarity -- Architecturally Similar to Standard GAL16V8 * PRELOAD AND POWER-ON RESET OF ALL REGISTERS -- 100% Functional Testability * APPLICATIONS INCLUDE: -- Battery Powered Systems -- DMA Control -- State Machine Control -- High Speed Graphics Processing * ELECTRONIC SIGNATURE FOR IDENTIFICATION
I 8 I
OLMC
OE
Functional Block Diagram
I/CLK
CLK
8 I 8 I
OLMC
I/O/Q
OLMC
I/O/Q
PROGRAMMABLE AND-ARRAY (64 X 32)
8
OLMC
I/O/Q
I/DPP
8
OLMC
I/O/Q
I
8
OLMC
I/O/Q
I
8
OLMC
I/O/Q
I 8
OLMC
I/O/Q
I/O/Q
I/OE
Description
The GAL16V8Z and GAL16V8ZD, at 100 A standby current and 12ns propagation delay provides the highest speed and lowest DESCRIPTION power combination PLD available in the market. The GAL16V8Z/ ZD is manufactured using Lattice Semiconductor's advanced zero power E2CMOS process, which combines CMOS with Electrically Erasable (E2) floating gate technology. The GAL16V8Z uses Input Transition Detection (ITD) to put the device in standby mode and is capable of emulating the full functionality of the standard GAL16V8. The GAL16V8ZD utilizes a dedicated power-down pin (DPP) to put the device in standby mode. It has 15 inputs available to the AND array. Unique test circuitry and reprogrammable cells allow complete AC, DC, and functional testing during manufacture. As a result, Lattice Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and data retention in excess of 20 years are specified.
Pin Configuration
DIP/SOIC PLCC
I/CLK Vcc I/O/Q
I/C LK I I 1 2 3 4 5 6 7 8 9 10 20 19 Vcc I/ O/ Q I/ O/ Q I/ O/ Q I/ O/ Q I/ O/ Q
I
3 I/DPP I I I I 6 4
I
1
19 18 I/O/Q I/O/Q 16 I/O/Q I/O/Q
GAL
18
GAL16V8Z GAL16V8ZD Top View
9
I GND
I/D P P I I
16V8Z 17 16V8ZD 16
15 14 13 12 11
I I
I GND
I/O/Q I/O/Q
I/ O/ Q I /O E
8
11
I/OE I/O/Q
14 13
I/O/Q
I/O/Q
Copyright (c) 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A. Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
December 1997
16v8zzd_03
1
Specifications GAL16V8Z GAL16V8ZD
GAL16V8Z/ZD Ordering Information
GAL16V8Z: Commercial Grade Specifications
Tpd (ns)
12
Tsu (ns)
10
Tco (ns)
8
Icc (mA)
55 55 55
Isb (A)
100 100 100 100 100 100
Ordering #
GAL16V8Z-12QP GAL16V8Z-12QJ GAL16V8Z-12QS GAL16V8Z-15QP GAL16V8Z-15QJ GAL16V8Z-15QS
Package
20-Pin Plastic DIP 20-Lead PLCC 20-Lead SOIC 20-Pin Plastic DIP 20-Lead PLCC 20-Lead SOIC
15
15
10
55 55 55
GAL16V8ZD: Commercial Grade Specifications
Tpd (ns)
12
Tsu (ns)
10
Tco (ns)
8
Icc (mA)
55 55
Isb (A)
100 100 100 100
Ordering #
GAL16V8ZD-12QP GAL16V8ZD-12QJ GAL16V8ZD-15QP GAL16V8ZD-15QJ
Package
20-Pin Plastic DIP 20-Lead PLCC 20-Pin Plastic DIP 20-Lead PLCC
15
15
10
55 55
Part Number Description
XXXXXXXX _ XX X XX
Device Name GAL16V8Z (Zero Power ITD) GAL16V8ZD (Zero Power DPP) Speed (ns) Active Power Q = Quarter Power
Grade Blank = Commercial Package P = Plastic DIP J = PLCC S = SOIC
2
Specifications GAL16V8Z GAL16V8ZD
Output Logic Macrocell (OLMC)
The following discussion pertains to configuring the output logic macrocell. It should be noted that actual implementation is accomplished by development software/hardware and is completely transparent to the user. There are three global OLMC configuration modes possible: simple, complex, and registered. Details of each of these modes is illustrated in the following pages. Two global bits, SYN and AC0, control the mode configuration for all macrocells. The XOR bit of each macrocell controls the polarity of the output in any of the three modes, while the AC1 bit of each of the macrocells controls the input/output configuration. These two global and 16 individual architecture bits define all possible configurations in a GAL16V8Z/ZD. The information given on these architecture bits is only to give a better understanding of the device. Compiler software will transparently set these architecture bits from the pin definitions, so the user should not need to directly manipulate these architecture bits.
Compiler Support for OLMC
Software compilers support the three different global OLMC modes as different device types. Most compilers also have the ability to automatically select the device type, generally based on the register usage and output enable (OE) usage. Register usage on the device forces the software to choose the registered mode. All combinatorial outputs with OE controlled by the product term will force the software to choose the complex mode. The software will choose the simple mode only when all outputs are dedicated combinatorial without OE control. For further details, refer to the compiler software manuals. When using compiler software to configure the device, the user must pay special attention to the following restrictions in each mode. In registered mode pin 1 and pin 11 are permanently configured as clock and output enable, respectively. These pins cannot be configured as dedicated inputs in the registered mode. In complex mode pin 1 and pin 11 become dedicated inputs and use the feedback paths of pin 19 and pin 12 respectively. Because of this feedback path usage, pin 19 and pin 12 do not have the feedback option in this mode. In simple mode all feedback paths of the output pins are routed via the adjacent pins. In doing so, the two inner most pins ( pins 15 and 16) will not have the feedback option as these pins are always configured as dedicated combinatorial output. When using the standard GAL16V8 JEDEC fuse pattern generated by the logic compilers for the GAL16V8ZD, special attention must be given to pin 4 (DPP) to make sure that it is not used as one of the functional inputs.
3
Specifications GAL16V8Z GAL16V8ZD
Registered Mode
In the Registered mode, macrocells are configured as dedicated registered outputs or as I/O functions. Architecture configurations available in this mode are similar to the common 16R8 and 16RP4 devices with various permutations of polarity, I/O and register placement. All registered macrocells share common clock and output enable control pins. Any macrocell can be configured as registered or I/O. Up to eight registers or up to eight I/Os are possible in this mode. Dedicated input or output functions can be implemented as subsets of the I/O function. Registered outputs have eight product terms per output. I/Os have seven product terms per output. Pin 4 is used as dedicated power-down pin on GAL16V8ZD. It cannot be used as functional input. The JEDEC fuse numbers, including the User Electronic Signature (UES) fuses and the Product Term Disable (PTD) fuses, are shown on the logic diagram on the following page.
CLK
Registered Configuration for Registered Mode - SYN=0. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this output configuration. - Pin 1 controls common CLK for the registered outputs. - Pin 11 controls common OE for the registered outputs. - Pin 1 & Pin 11 are permanently configured as CLK & OE for registered output configuration.
D
Q Q
XOR
OE
Combinatorial Configuration for Registered Mode - SYN=0. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1 defines this output configuration. - Pin 1 & Pin 11 are permanently configured as CLK & OE for registered output configuration.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
4
Specifications GAL16V8Z GAL16V8ZD
Registered Mode Logic Diagram
DIP, SOIC & PLCC Package Pinouts
1
0 4 8 12 16 20
24
28
2128 PTD
0000
OLMC
0224
19
2
0256
XOR-2048 AC1-2120
OLMC
0480
18
3
0512
XOR-2049 AC1-2121
OLMC
0736
17
*4
0768
XOR-2050 AC1-2122
OLMC
0992
16
5
1024
XOR-2051 AC1-2123
OLMC
1248
15
6
1280
XOR-2052 AC1-2124
OLMC
1504
14
7
1536
XOR-2053 AC1-2125
OLMC
1760
13
8
1792
XOR-2054 AC1-2126
OLMC
2016
12
9
2191
XOR-2055 AC1-2127
OE
11
64-USER ELECTRONIC SIGNATURE FUSES 2056, 2057, .... .... 2118, 2119 Byte7 Byte6 .... .... Byte1 Byte0 MSB LSB
SYN-2192 AC0-2193 * Note: Input not available on GAL16V8ZD
5
Specifications GAL16V8Z GAL16V8ZD
Complex Mode
In the Complex mode, macrocells are configured as output only or I/O functions. Architecture configurations available in this mode are similar to the common 16L8 and 16P8 devices with programmable polarity in each macrocell. Up to six I/Os are possible in this mode. Dedicated inputs or outputs can be implemented as subsets of the I/O function. The two outer most macrocells (pins 12 & 19) do not have input capability. Designs requiring eight I/Os can be implemented in the Registered mode. All macrocells have seven product terms per output. One product term is used for programmable output enable control. Pins 1 and 11 are always available as data inputs into the AND array. Pin 4 is used as dedicated power-down pin on GAL16V8ZD. It cannot be used as functional input. The JEDEC fuse numbers including the UES fuses and PTD fuses are shown on the logic diagram on the following page.
Combinatorial I/O Configuration for Complex Mode - SYN=1. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1 has no effect on this mode. - Pin 13 through Pin 18 are configured to this function.
XOR
Combinatorial Output Configuration for Complex Mode - SYN=1. - AC0=1. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1 has no effect on this mode. - Pin 12 and Pin 19 are configured to this function.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
6
Specifications GAL16V8Z GAL16V8ZD
Complex Mode Logic Diagram
DIP, SOIC & PLCC Package Pinouts
1
2128
0
0000
4
8
12
16
20
24
28
PTD
OLMC
0224
19
2
0256
XOR-2048 AC1-2120
OLMC
0480
18
3
0512
XOR-2049 AC1-2121
OLMC
0736
17
*4
0768
XOR-2050 AC1-2122
OLMC
0992
16
5
1024
XOR-2051 AC1-2123
OLMC
1248
15
6
1280
XOR-2052 AC1-2124
OLMC
1504
14
7
1536
XOR-2053 AC1-2125
OLMC
1760
13
8
1792
XOR-2054 AC1-2126
OLMC
2016
12
9
XOR-2055 AC1-2127
11
2191
64-USER ELECTRONIC SIGNATURE FUSES 2056, 2057, .... .... 2118, 2119 Byte7 Byte6 .... .... Byte1 Byte0 MSB LSB
SYN-2192 AC0-2193 * Note: Input not available on GAL16V8ZD
7
Specifications GAL16V8Z GAL16V8ZD
Simple Mode
In the Simple mode, macrocells are configured as dedicated inputs or as dedicated, always active, combinatorial outputs. Architecture configurations available in this mode are similar to the common 10L8 and 12P6 devices with many permutations of generic output polarity or input choices. All outputs in the simple mode have a maximum of eight porduct terms that can control the logic. In addition, each output has programmable polarity. Pins 1 and 11 are always available as data inputs into the AND array. The center two macrocells (pins 15 & 16) cannot be used in the input configuration. Pin 4 is used as dedicated power-down pin on GAL16V8ZD. It cannot be used as functional input. The JEDEC fuse numbers including the UES fuses and PTD fuses are shown on the logic diagram.
Vcc
Combinatorial Output with Feedback Configuration for Simple Mode - SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this configuration. - All OLMC except pins 15 & 16 can be configured to this function.
XOR
Combinatorial Output Configuration for Simple Mode
Vcc
XOR
- SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=0 defines this configuration. - Pins 15 & 16 are permanently configured to this function.
Dedicated Input Configuration for Simple Mode - SYN=1. - AC0=0. - XOR=0 defines Active Low Output. - XOR=1 defines Active High Output. - AC1=1 defines this configuration. - All OLMC except pins 15 & 16 can be configured to this function.
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
8
Specifications GAL16V8Z GAL16V8ZD
Simple Mode Logic Diagram
DIP, SOIC & PLCC Package Pinouts
1
2128
0
0000
4
8
12
16
20
24
28
PTD
OLMC
XOR-2048 AC1-2120
19
0224
2
0256
OLMC
XOR-2049 AC1-2121
18
0480
3
0512
OLMC
XOR-2050 AC1-2122
17
0736
*4
0768
OLMC
XOR-2051 AC1-2123
16
0992
5
1024
OLMC
XOR-2052 AC1-2124
15
1248
6
1280
OLMC
XOR-2053 AC1-2125
14
1504
7
1536
OLMC
XOR-2054 AC1-2126
13
1760
8
1792
OLMC
XOR-2055 AC1-2127
12 11
2016
9
2191
64-USER ELECTRONIC SIGNATURE FUSES 2056, 2057, .... .... 2118, 2119 Byte7 Byte6 .... .... Byte1 Byte0 MSB LSB
SYN-2192 AC0-2193 * Note: Input not available on GAL16V8ZD
9
Specifications GAL16V8Z GAL16V8ZD
Absolute Maximum Ratings(1)
Supply voltage VCC ........................................ -.5 to +7V Input voltage applied .......................... -2.5 to VCC +1.0V Off-state output voltage applied ......... -2.5 to VCC +1.0V Storage Temperature ................................ -65 to 150C Ambient Temperature with Power Applied ........................................... -55 to 125C
1. Stresses above those listed under the "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications).
Recommended Operating Conditions
Commercial Devices: Ambient Temperature (TA) ............................... 0 to 75C Supply voltage (VCC) with Respect to Ground ..................... +4.75 to +5.25V
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified) SYMBOL PARAMETER Input Low Voltage Input High Voltage Input or I/O Low Leakage Current Input or I/O High Leakage Current Output Low Voltage Output High Voltage 0V VIN VIL (MAX.) 3.5V VIN VCC IOL = MAX. Vin = VIL or VIH IOH = MAX. Vin = VIL or VIH IOH = -100 A Vin = VIL or VIH CONDITION MIN.
Vss - 0.5
TYP.2 -- -- -- -- -- -- -- -- -- --
MAX. 0.8 Vcc+1
UNITS V V A A V V V mA mA mA
VIL VIH IIL IIH VOL VOH IOL IOH IOS1
2.0 -- -- -- 2.4 Vcc-1 -- -- VCC = 5V VOUT = 0.5V TA = 25C -30
-10
10 0.5 -- -- 16 -3.2 -150
Low Level Output Current High Level Output Current Output Short Circuit Current
COMMERCIAL ISB Stand-by Power
Supply Current
VIL = GND VIH = Vcc Outputs Open
Z-12/-15 ZD-12/-15 Z-12/-15 ZD-12/-15
--
50
100
A
ICC
Operating Power Supply Current
VIL = 0.5V VIH = 3.0V ftoggle = 15 MHz Outputs Open
--
--
55
mA
1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground degradation. Characterized but not 100% tested. 2) Typical values are at Vcc = 5V and TA = 25 C
Capacitance (TA = 25C, f = 1.0 MHz)
SYMBOL CI CI/O PARAMETER Input Capacitance I/O Capacitance MAXIMUM* 10 10 UNITS pF pF TEST CONDITIONS VCC = 5.0V, VI = 2.0V VCC = 5.0V, VI/O = 2.0V
*Characterized but not 100% tested.
10
Specifications GAL16V8Z Specifications GAL16V8Z GAL16V8ZD
AC Switching Characteristics
Over Recommended Operating Conditions
COM PARAMETER COM
TEST COND1. A A -- -- -- A
DESCRIPTION Input or I/O to Combinational Output Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output DIsabled Last Active Input to Standby Standby to Active Output 3 2 -- 10 0 55
-12 MIN. MAX. 12 8 6 -- -- --
-15 MIN. MAX. 3 2 -- 15 0 40 15 10 7 -- -- -- UNITS ns ns ns ns ns MHz
tpd tco tcf2 tsu th
fmax3
A A
62.5 83.3
-- --
45.5 62.5
-- --
MHz MHz
twh twl ten tdis tas tsa4
-- -- B B C C -- --
6 6 -- -- -- -- 60 6
-- -- 12 12 15 12 140 13
8 8 -- -- -- -- 50 5
-- -- 15 15 15 15 150 15
ns ns ns ns ns ns ns ns
1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Specification section. 3) Refer to fmax Specification section. 4) Add tsa to tpd, tsu, ten and tdis when the device is coming out of standby state.
Standby Power Timing Waveforms
Icc POWER Isb INPUT or I/O FEEDBACK ten, tdis OE * CLK tco OUTPUT tsu * Note: Rising clock edges are allowed during tsa but outputs are not guaranteed. tas tsa tpd
11
Specifications GAL16V8ZD
AC Switching Characteristics
Over Recommended Operating Conditions
COM PARAMETER COM
TEST COND1. A A -- -- -- A
DESCRIPTION Input or I/O to Combinational Output Clock to Output Delay Clock to Feedback Delay Setup Time, Input or Feedback before Clock Hold Time, Input or Feedback after Clock Maximum Clock Frequency with External Feedback, 1/(tsu + tco) Maximum Clock Frequency with Internal Feedback, 1/(tsu + tcf) Maximum Clock Frequency with No Feedback Clock Pulse Duration, High Clock Pulse Duration, Low Input or I/O to Output Enabled OE to Output Enabled Input or I/O to Output Disabled OE to Output Disabled 3 2 -- 10 0 55
-12 MIN. MAX. 12 8 6 -- -- --
-15 MIN. MAX. 3 2 -- 15 0 40 15 10 7 -- -- -- UNITS ns ns ns ns ns MHz
tpd tco tcf2 tsu th
fmax3
A A
62.5 83.3
-- --
45.5 62.5
-- --
MHz MHz
twh twl ten tdis
-- -- B B C C
6 6 -- -- -- --
-- -- 12 12 15 12
8 8 -- -- -- --
-- -- 15 15 15 15
ns ns ns ns ns ns
1) Refer to Switching Test Conditions section. 2) Calculated from fmax with internal feedback. Refer to fmax Specification section. 3) Refer to fmax Specification section.
12
Specifications GAL16V8ZD
Dedicated Power-Down Pin Specifications
Over Recommended Operating Conditions
COM PARAMETER COM
TEST COND1. -- --
DESCRIPTION DPP Pulse Duration High DPP Pulse Duration Low 12 25
-12 MIN. MAX. -- --
-15 MIN. MAX. 15 30 -- -- UNITS ns ns
twhd twld tivdh tgvdh tcvdh tdhix tdhgx tdhcx tdliv tdlgv tdlcv tdlov
ACTIVE TO STANDBY -- -- -- -- -- -- Valid Input before DPP High Valid OE before DPP High Valid Clock Before DPP High Input Don't Care after DPP High OE Don't Care after DPP High Clock Don't Care after DPP High 5 0 0 -- -- -- -- -- -- 2 6 8 8 0 0 -- -- -- -- -- -- 5 9 11 ns ns ns ns ns ns
STANDBY TO ACTIVE -- -- -- A DPP Low to Valid Input DPP Low to Valid OE DPP Low to Valid Clock DPP Low to Valid Output 12 16 18 5 -- -- -- 24 15 20 20 5 -- -- -- 30 ns ns ns ns
1) Refer to Switching Test Conditions section.
Dedicated Power-Down Pin Timing Waveforms
DPP tivdh INPUT or I/O FEEDBACK tgvdh OE tcvdh CLK
tco tpd, ten, tdis
tdhix
tdliv
tdhgx
tdlgv
tdhcx
tdlcv
tdlov
OUTPUT
13
Specifications GAL16V8Z GAL16V8ZD
Switching Waveforms
INPUT or I/O FEEDBACK
VALID INPUT
INPUT or I/O FEEDBACK
VALID INPUT
tsu
CLK
th
tpd
COMBINATIONAL OUTPUT
tco
REGISTERED OUTPUT
Combinatorial Output
1/fmax (external fdbk)
INPUT or I/O FEEDBACK
Registered Output
tdis
COMBINATIONAL OUTPUT
ten
OE
tdis
Input or I/O to Output Enable/Disable
REGISTERED OUTPUT
ten
OE to Output Enable/Disable
twh
CLK
twl
CLK
1/fmax (w/o fb)
1/fmax (internal fdbk)
tcf
Clock Width
REGISTERED FEEDBACK
tsu
fmax with Feedback
14
Specifications GAL16V8Z GAL16V8ZD
fmax Descriptions
CLK
LOGIC ARRAY
REGISTER
CLK
LOGIC ARRAY
tsu
tco
REGISTER
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback is calculated from measured tsu and tco.
CLK
tcf tpd
fmax with Internal Feedback 1/(tsu+tcf)
LOGIC ARRAY REGISTER
tsu + th
fmax with No Feedback Note: fmax with no feedback may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%. Switching Test Conditions
Input Pulse Levels Input Rise and Fall Times Input Timing Reference Levels Output Timing Reference Levels Output Load GND to 3.0V 3ns 10% - 90% 1.5V 1.5V See Figure
Note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. For example, the timing from clock to a combinatorial output is equal to tcf + tpd.
+5V
R1
3-state levels are measured 0.5V from steady-state active level. Output Load Conditions (see figure) Test Condition A B Active High Active Low C Active High Active Low R1 300 300 300 R2 390 390 390 390 390 CL 50pF 50pF 50pF 5pF 5pF
FROM OUTPUT (O/Q) UNDER TEST
TEST POINT
R2
C L*
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
15
Specifications GAL16V8Z GAL16V8ZD
Electronic Signature
An electronic signature word is provided in every GAL16V8Z/ZD device. It contains 64 bits of reprogrammable memory that can contain user defined data. Some uses include user ID codes, revision numbers, or inventory control. The signature data is always available to the user independent of the state of the security cell. NOTE: The electronic signature is included in checksum calculations. Changing the electronic signature will alter checksum.
Output Register Preload
When testing state machine designs, all possible states and state transitions must be verified in the design, not just those required in the normal machine operations. This is because, in system operation, certain events occur that may throw the logic into an illegal state (power-up, line voltage glitches, brown-outs, etc.). To test a design for proper treatment of these conditions, a way must be provided to break the feedback paths, and force any desired (i.e., illegal) state into the registers. Then the machine can be sequenced and the outputs tested for correct next state conditions. The GAL16V8Z/ZD devices includes circuitry that allows each registered output to be synchronously set either high or low. Thus, any present state condition can be forced for test sequencing. If necessary, approved GAL programmers capable of executing test vectors perform output register preload automatically.
Security Cell
A security cell is provided in the GAL16V8Z/ZD devices to prevent unauthorized copying of the array patterns. Once programmed, this cell prevents further read access to the functional bits in the device. This cell can only be erased by re-programming the device, so the original configuration can never be examined once this cell is programmed. The electronic signature data is always available to the user, regardless of the state of this security cell.
Input Buffers
GAL16V8Z/ZD devices are designed with TTL level compatible INPUT BUFFERS input buffers. These buffers, with their characteristically high impedance, load driving logic much less than traditional bipolar devices. This allows for a greater fan out from the driving logic. GAL16V8Z/ZD input buffers have latches within the buffers. As a result, when the device goes into standby mode the inputs will be latched to its values prior to standby. In order to overcome the input latches, they will have to be driven by an external source. Lattice Semiconductor recommends that all unused inputs and tri-stated I/O pins for both devices be connected to another active input, VCC, or GND. Doing this will tend to improve noise immunity and reduce ICC for the device.
Device Programming
GAL devices are programmed using a Lattice Semiconductorapproved Logic Programmer, available from a number of manufacturers (see the Development Tools Section of the Data Book). Complete programming of the device takes only a few seconds. Erasing of the device is transparent to the user, and is done automatically as part of the programming cycle.
Input Transition Detection (ITD)
The GAL16V8Z relies on its internal input detection circuitry to put the device in to power down mode. If there is no input transition for the specified period of time, the device will go into the power down state. Any valid input transition will put the device back into the active state. The first rising clock transition from power-down state only acts as a wake up signal to the device and will not clock the data input through to the output (refer to standby power timing waveform for more detail). Any input pulse widths greater than 5ns at input voltage level of 1.5V will be detected as input transition. The device will not detect any input pulse widths less than 1ns measured at input voltage level of 1.5V as an input transition.
Typical Input Characteristic
40 30
Input Current (A)
20 10 0 -10 -20 -30 -40 0 1 2 3 4 5
Dedicated Power-Down Pin
The GAL16V8ZD uses pin 4 as the dedicated power-down signal to put the device in to the power-down state. DPP is an active high signal where a logic high driven on this signal puts the device into power-down state. Input pin 4 cannot be used as a functional input on this device.
Input Voltage (Volts)
16
Specifications GAL16V8Z GAL16V8ZD
Power-Up Reset
Vcc
Vcc (min.)
tsu
CLK
twl tpr
INTERNAL REGISTER Q - OUTPUT
Internal Register Reset to Logic "0"
FEEDBACK/EXTERNAL OUTPUT REGISTER
Device Pin Reset to Logic "1"
Circuitry within the GAL16V8Z/ZD provides a reset signal to all registers during power-up. All internal registers will have their Q outputs set low after a specified time (tpr, 1s MAX). As a result, the state on the registered output pins (if they are enabled) will always be high on power-up, regardless of the programmed polarity of the output pins. This feature can greatly simplify state machine design by providing a known state on power-up. The timing diagram for power-up is shown below. Because of the
asynchronous nature of system power-up, some conditions must be met to provide a valid power-up reset of the GAL16V8Z/ZD. First, the VCC rise must be monotonic. Second, the clock input must be at static TTL level as shown in the diagram during power up. The registers will reset within a maximum of tpr time. As in normal system operation, avoid clocking the device until all input and feedback path setup times have been met. The clock must also meet the minimum pulse width requirements.
Input/Output Equivalent Schematics
PIN
PIN
Feedback
Vcc
Vcc
ESD Protection Circuit
Vcc
Tri-State Control
Vcc
PIN
Data Output
PIN
ESD Protection Circuit
Feedback (To Input Buffer)
Typical Input
Typical Output
17
Specifications GAL16V8Z GAL16V8ZD
Typical AC and DC Characteristics
Normalized Tpd vs Vcc
1.2 1.2
Normalized Tco vs Vcc
1.4
Normalized Tsu vs Vcc
Normalized Tpd
1.1
Normalized Tco
PT L->H
1
1.1
FALL
Normalized Tsu
PT H->L
RISE
1.3 1.2 1.1 1 0.9 0.8
PT H->L PT L->H
1
0.9
0.9
0.8 4.50 4.75 5.00 5.25 5.50
0.8 4.50 4.75 5.00 5.25 5.50
4.50
4.75
5.00
5.25
5.50
Supply Voltage (V)
Supply Voltage (V)
Supply Voltage (V)
Normalized Tpd vs Temp
1.3 1.3
Normalized Tco vs Temp
1.4
Normalized Tsu vs Temp
Normalized Tpd
Normalized Tco
Normalized Tsu
1.2 1.1 1 0.9 0.8 0.7
PT H->L PT L->H
1.2 1.1 1 0.9 0.8 0.7
RISE FALL
1.3 1.2 1.1 1 0.9 0.8 0.7
PT H->L PT L->H
0
0
100
100
125
125
-55
-25
25
50
25
50
-55
-25
75
75
-55
-25
0
25
50
75
100
Temperature (deg. C)
Temperature (deg. C)
Temperature (deg. C)
Delta Tpd vs # of Outputs Switching
0 0
Delta Tco vs # of Outputs Switching
Delta Tpd (ns)
-0.5
Delta Tco (ns)
-0.5
-1
-1
RISE
-1.5
RISE
-1.5
FALL
-2 1 2 3 4 5 6 7 8
FALL
-2 1 2 3 4 5 6 7 8
Number of Outputs Switching Delta Tpd vs Output Loading
10 10
Number of Outputs Switching
Delta Tco vs Output Loading
Delta Tpd (ns)
8 6 4 2 0 -2 0 50
RISE FALL
Delta Tco (ns)
8 6 4 2 0 -2
RISE FALL
100
150
200
250
300
0
50
100
150
200
250
300
Output Loading (pF)
Output Loading (pF)
18
125
Specifications GAL16V8Z GAL16V8ZD
Typical AC and DC Characteristics
Vol vs Iol
1.5 1.25 5 4
Voh vs Ioh
5 4.5
Voh vs Ioh
Voh (V)
Voh (V)
Vol (V)
1 0.75 0.5 0.25 0 0.00 20.00 40.00 60.00
3 2 1 0 0.00 10.00 20.00 30.00 40.00 50.00 60.00
4 3.5 3 2.5 0.00 1.00 2.00 3.00 4.00
Iol (mA)
Ioh(mA)
Ioh(mA)
Normalized Icc vs Vcc
1.30 1.2
Normalized Icc vs Temp
1.30
Normalized Icc vs Freq. (DPP & ITD > 10MHz)
Normalized Icc
Normalized Icc
1.20 1.10 1.00 0.90 0.80 0.70 4.50 4.75 5.00 5.25 5.50
Normalized Icc
-55 -25 0 25 50 75 100 125
1.1
1.20 1.10 1.00 0.90 0.80 0 25 50 75 100
1
0.9
0.8
Supply Voltage (V)
Temperature (deg. C)
Frequency (MHz)
Delta Icc vs Vin (1 input)
5 4 3 2 1 0 0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00 0 10 20
Input Clamp (Vik)
1
Normalized Icc vs Freq. (ITD)
Iik (mA)
30 40 50 60 70 80 90 -1.00 -0.80 -0.60 -0.40 -0.20 0.00
Normalized Icc
Delta Icc (mA)
0.8
0.6
0.4
0.2
0 1 10 100 1000 10000
Vin (V)
Vik (V)
Frequency (KHz)
19

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